Powder X-ray Diffraction Facility (PXRD)

SIC

Sophisticated instrumentation center (SIC) was established in September 2011 to expedite the research program at IIT Indore. SIC has now emerged as one of the first such centers in the country providing extensive analytical instrument support to the users of the research fraternity across the country. A major advantage of SIC is its accessibility to the students within the institute as well as to other institutes and industries. A very healthy ratio of students to the time availability on instruments, and quick analysis of external samples makes it a very useful facility.

Model

Rigaku SmartLab, Automated Multipurpose x-ray Diffractometer

Features

High-accuracy theta-theta goniometer: Enables omega scans, 2-theta/omega scans, and 2-theta scans with the sample oriented horizontally. Additionally, the two axes are equipped with encoders to enable control of each axis with a resolution of 0.0001.
Attachments: Standard Powder XRD attachment, RxRy attachment (for sample tilt alignment, for thin film and rocking curve measurement), Phi-Chi attachment (for thin film, reflectivity).
X-ray Generator: 3 kW sealed tube x-ray generator (Max. voltage 60kV, Max. current 50mA, with Cu target)
Cross beam optics (CBO): Changing the selection slits allows easy switching between the direct beam for para-focusing (Bragg-Brentano or BB) optics and a monochromatic parallel using a multilayer mirror. Para-focusing optics is applied to the measurement of phase ID analysis and quantitative analysis of powder samples. Parallel beam (PB) optics is applied to the measurement of profile analysis of powder samples, measurement of preferred orientation, measurement of thin film samples, and rocking curve measurement.
Detector: (i) 0D Scintillation Counter (point detector), (ii)1D Semiconductor Detector

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