Model
Wave by Oxford Instruments
Features
Optimized element detection for low and high energy X-rays
Accurate quantitative analysis below 500ppm
Less than 10eV resolution for resolving important overlaps like Sulfur/Molybdenum
Rivals EPMA accuracy with WD for trace elements and ED for major elements using XPP quantitative correction algorithms
Applications
- Most accurate elemental analysis available for SEM
- Easily and unambiguously determines the distribution of all elements in a sample even where peaks overlap
- accurate trace element analysis, and optimized element detection for low and high energy X-rays to provide “Microprobe Accuracy on an SEM”
