IIT Indore, Khandwa Road, Simrol- 453552, Indore (MP)
Tel. +91-731-660- 3311
Email- sic@iiti.ac.in

Scanning Electron Microscopy (FE-SEM)

A National Facility Indian Institute of Technology Indore

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FE-SEM Supra 55 (Carl Zeiss, Germany)


GEMINI Technology with high efficiency in-lens detector and no magnetic field at specimen level.
Superb resolution and image quality at high and low operating voltages.
Extremely wide operating voltage range from 0.02-30kV.
Designed-in ease of use with minimal adjustments required when changing operating conditions.
Short analytical working distance of 8.5 mm for simultaneous high resolution imaging and X-ray analysis.
High probe current (up to 100 nA) with high stability (better than 0.2%/h) for precise analytical results.
Variable Pressure (VP) mode up to 133Pa for superb imaging of non conductive samples.
Multi-User friendly with Windows® based SmartSEM control software.


  • Estimation of particle morphology, particle size and size distribution.
  • Elemental analysis using EDX mode.
  • Film evaluations
  • Characterization of very fine specimen features
  • Microstructure studies