IIT Indore, Khandwa Road, Simrol- 453552, Indore (MP)
Tel. +91-731-660- 3311
Email- sic@iiti.ac.in

X-ray Absorption Fine Structure (XAFS)

A National Facility Indian Institute of Technology Indore

Created with Sketch.


R-XAS by RIGAKU, Japan


EXAFS provides precise local structural information like bond distances, coordination number and type of neighboring atoms, and disorder in crystalline or non-crystalline systems.
XANES provides the oxidation state of the absorbing ion, thus providing information related to charging transfer, orbital occupancy, and symmetry around the absorbing ion.

Measurement Specification

  • Room temperature measurements only
  • Samples in powder form are preferred, though measurement on thin films is possible.
  • Measurement is possible for all 1st-row transition metal cations (Ti to Cu) and 1st-row Lanthanides (Ce to Lu).


  • Materials Science
  • Semiconductors
  • Biological Science
  • Nanotechnology
  • Pharmaceuticals.